Evaluation of Iron Nitride Film Resistors Deposited by Reactive Sputtering Method.
نویسندگان
چکیده
منابع مشابه
Growth, structural, and magnetic properties of iron nitride thin films deposited by dc magnetron sputtering
FeN thin films were deposited on glass substrates by dc magnetron sputtering at different Ar/N2 discharges. The composition, structure and the surface morphology of the films were characterized using X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), and atomic force microscopy (AFM). Films deposited at different nitrogen pressures exhibited different structures with different nit...
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ژورنال
عنوان ژورنال: SHINKU
سال: 1995
ISSN: 0559-8516,1880-9413
DOI: 10.3131/jvsj.38.350